ISTFA 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis

ISTFA 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis

English | 2015 | ISBN: 162708102X | 500 Pages | PDF | 159.5 MB

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!

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