Introduction to Infrared and Electro-Optical Systems, Second Edition (Artech Optoelectronics and Applied Optics)

Introduction to Infrared and Electro-Optical Systems, Second Edition (Artech Optoelectronics and Applied Optics)

English | 2012 | ISBN: 1608071006, 9781608071005 | 488 Pages | PDF | 54.87 MB

This newly revised and updated edition of a classic Artech House book offers a current and complete introduction to the analysis and design of Electro-Optical (EO) imaging systems. The Second Edition provides numerous updates and brand new coverage of today s most important areas, including the integrated spatial frequency approach and a focus on the weapons of terrorists as objects of interest.This comprehensive reference details the principles and components of the Linear Shift-Invariant (LSI) infrared and electro-optical systems and shows you how to combine this approach with calculus and domain transformations to achieve a successful imaging system analysis. Ultimately, the steps described in this book lead to results in quantitative characterizations of performance metrics such as modulation transfer functions, minimum resolvable temperature difference, minimum resolvable contrast, and probability of object discrimination.The book includes an introduction to two-dimensional functions and mathematics which can be used to describe image transfer characteristics and imaging system components. You also learn diffraction concepts of coherent and incoherent imaging systems which show you the fundamental limits of their performance. By using the evaluation procedures contained in this desktop reference, you become capable of predicting both sensor test and field performance and quantifying the effects of component variations. This practical resource includes over 780 time-saving equations.Contents: Introduction. Mathematics. LSI Systems. Diffraction. Sources of Radiation. Atmospherics. Optics. Detectors and Scanners. Electronics. Signal Processing Displays on Human Perception. Historical Performance Models. CTF and the TTP Metric. EO/IR Systems and Target Acquisition. Search. Laboratory and Field Testing.

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