Reliability of MEMS: Testing of Materials and Devices

Reliability of MEMS: Testing of Materials and Devices

English | 2008 | ISBN: 3527314946 | PDF | 326 Pages | 5.3 MB

This first book to cover exclusively and in detail the principles, tools and methods for determining the reliability of microelectromechanical materials, components and devices covers both component materials as well as entire MEMS devices. Divided into two major parts, following a general introductory chapter to reliability issues, the first part looks at the mechanical properties of the materials used in MEMS, explaining in detail the necessary measuring technologies -- nanoindenters, bulge methods, bending tests, tensile tests, and others. Part Two treats the actual devices, organized by important device categories such as pressure sensors, inertial sensors, RF MEMS, and optical MEMS.

Download:

http://longfiles.com/vpwa92hdbyr8/Reliability_of_MEMS_Testing_of_Materials_and_Devices.pdf.html

[Fast Download] Reliability of MEMS: Testing of Materials and Devices


Ebooks related to "Reliability of MEMS: Testing of Materials and Devices" :
Parallel Power Electronics Filters in Three-Phase Four-Wire Systems: Principle, Control and Design
Thermal Transport in Strongly Correlated Rare-Earth Intermetallic Compounds
Signal Integrity: Applied Electromagnetics and Professional Practice
Romansy 13: Theory and Practice of Robots and Manipulators
Stretchable Bioelectronics for Medical Devices and Systems (Microsystems and Nanosystems)
Circuit Design: Know It All
Transistor Circuits for The Constructor No.3
Engineer's Mini-Notebook: Science Projects
Engineering Mathematics (Pocket Books), Third Edition
Chips 2020, Volume 2: New Vistas in Nanoelectronics
Copyright Disclaimer:
This site does not store any files on its server. We only index and link to content provided by other sites. Please contact the content providers to delete copyright contents if any and email us, we'll remove relevant links or contents immediately.