Sample Preparation Handbook for Transmission Electron Microscopy: Methodology



Sample Preparation Handbook for Transmission Electron Microscopy: Methodology
Springer; 1st Edition. edition (July 8, 2010) | ISBN: 0387981810 | 272 pages | File type: PDF | 8 mb

This comprehensive guide to sample preparation for the transmission electron microscope is divided into two main sections. The first covers theoretical and practical aspects, including the best preparative technique taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artefacts brought about by mechanical, physical and chemical methods. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice.

The remainder of the book is dedicated to technical hints, including 22 detailed protocols for preparing thin slices for TEM analysis. Experimental conditions and guidelines, options and variations, advantages and constraints, common artefacts, and theoretical issues are considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. Finally, a practical, authoritative, and interdisciplinary handbook is available to guide you through all of the most current techniques for successful sample preparation in all fields from materials science to biology.



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